http://en.wikipedia.org/wiki/Profilometer 출처: 위키피디아
- Vertical scanning interferometry / White light interferometry
- Phase shifting interferometry
- Differential interference contrast microscopy (Nomarski microscopy)
- Focus detection methods
- Intensity detection
- Focus variation
- Differential detection
- Critical angle method
- Astigmatic Method
- Foucault method
- Confocal microscopy
- Pattern projection methods
- Stylus profilometer (mechanical profilometer)[3]
- Atomic Force Microscopy
- Scanning Tunneling Microscopy
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