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모델:DSF500

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By 1 scanning, contour and roughness or waviness are able to be gained

• High resolution and wide dynamic range
• Suitable for complex-shape precision components

Z resolution / measuring range	0.0075 μm / 5 mm  0.012 μm / 8 mm
Stylus	R2 μm / 0.75 mN / 60 °  R25 μm / 10 mN / 25°
Analysis item	Contour (element, scalar, statistics, tolerance judge) Roughness (JIS, ISO, DIN, ANSI, BS) Waviness (JIS)