DSF500
By 1 scanning, contour and roughness or waviness are able to be gained
- High resolution and wide dynamic range
- Suitable for complex-shape precision components
| Z resolution / measuring range | 0.0075 μm / 5 mm 0.012 μm / 8 mm |
|---|---|
| Stylus | R2 μm / 0.75 mN / 60 ° R25 μm / 10 mN / 25° |
| Analysis item | Contour (element, scalar, statistics, tolerance judge) Roughness (JIS, ISO, DIN, ANSI, BS) Waviness (JIS) |
DSF800
DSF800 is a digital contour and roughness measuring instrument to achieve wide dynamic range measurements with high accuracy.
- Various parameters of surface roughness or waviness and various contour are analyzable.
| Z resolution / measuring range | 0.00075 μm / ±6 mm (0.0015 μm / ±12 mm) |
|---|---|
| Z detection method | Semiconductor laser scale |
| Stylus | R2 μm / 0.75 mN / 60° R25 μm / 10 mN / 25° |
| Analysis item | Contour (element, scalar, statistics, master comparison, tolerance judge) Roughness (JIS, ISO, DIN, ANSI, BS) Waviness (JIS) |
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